The EDO's Palletized
Avionics Instrumentation System (PAIS) is a MIL-SPEC, distributed
multiprocessor, VME based instrumentation system.
Palletized Avionics Instrumentation System is housed
in a single full ATR chassis, PAIS collects, filters, time stamps
and records data from various sources including MIL-STD-1553B and
high speed digital.
The VME architectures inherent growth capability
allows for collection of many different types of data from multiple
data sources. Collection of individual data parameters from each data
source is completely user definable. Once collected, data is recorded
on SCSI compatible devices via SCSI interface.
The PAIS is user controlled through a Programmable Pushbutton
switch control panel. The control panel is utilized to sequence the
user through various control and status menus. These menus are customized
for the required user function.
The Palletized Avionics Instrumentation
System is a single integrated palletized avionics instrumentation
system. Collects multiple MIL-STD-1553B and high speed parallel bus
data simultaneously.
Operational testing:
Supports multi-mission testing. Single sorties can accomplish
multiple test objectives vs multiple sorties and multiple instrumentation
systems to accomplish the same test objectives.
Supports multi-mission testing:
PAIS architecture supports a wide variety of instrumentation
interfaces for almost any instrumentation requirement.